Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV Curve and Complex Admittance Measurements
نویسندگان
چکیده
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ژورنال
عنوان ژورنال: Journal of Low Temperature Physics
سال: 2018
ISSN: 0022-2291,1573-7357
DOI: 10.1007/s10909-018-1970-8